"Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems."

Byoungho Kim, Jacob A. Abraham (2012)

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DOI: 10.1109/TCSII.2012.2220693

access: closed

type: Journal Article

metadata version: 2020-05-27

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Byoungho Kim, Jacob A. Abraham:
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. IEEE Trans. Circuits Syst. II Express Briefs 59-II(11): 785-789 (2012)

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