"DRAM Yield Analysis and Optimization by a Statistical Design Approach."

Yan Li et al. (2011)

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DOI: 10.1109/TCSI.2011.2157741

access: closed

type: Journal Article

metadata version: 2020-05-22

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Yan Li, Helmut Schneider, Florian Schnabel, Roland Thewes, Doris Schmitt-Landsiedel:
DRAM Yield Analysis and Optimization by a Statistical Design Approach. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(12): 2906-2918 (2011)

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