"Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit."

Zhiqiang Liu, Shravan K. Chaganti, Degang Chen (2018)

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DOI: 10.1109/TCSI.2017.2751561

access: closed

type: Journal Article

metadata version: 2022-07-26

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Zhiqiang Liu, Shravan K. Chaganti, Degang Chen:
Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(5): 1664-1674 (2018)

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