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"A Design-Oriented Soft Error Rate Variation Model Accounting for Both ..."
Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry (2010)
- Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry:
A Design-Oriented Soft Error Rate Variation Model Accounting for Both Die-to-Die and Within-Die Variations in Submicrometer CMOS SRAM Cells. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(6): 1298-1311 (2010)
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