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"Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo ..."

Hyunwoo Nho et al. (2008)

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DOI: 10.1109/TCSII.2008.923411

access: closed

type: Journal Article

metadata version: 2020-05-27

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  - https://dblp.org/rec/journals/tcas/NhoYWJ08
Hyunwoo Nho, Sei-Seung Yoon, S. Simon Wong, Seong-Ook Jung:
Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo Simulation. IEEE Trans. Circuits Syst. II Express Briefs 55-II(9): 907-911 (2008)

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