"Pathological Element-Based Active Device Models and Their Application to ..."

Carlos Sánchez-López et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TCSI.2010.2097696

access: closed

type: Journal Article

metadata version: 2020-10-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/Sanchez-LopezFTT11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/Sanchez-LopezFTT11
Carlos Sánchez-López, Francisco V. Fernández, Esteban Tlelo-Cuautle, Sheldon X.-D. Tan:
Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(6): 1382-1395 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.