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"Modeling and Evaluating the Gate Length Dependence of BTI."

Victor M. van Santen, Hussam Amrouch, Jörg Henkel (2019)

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DOI: 10.1109/TCSII.2018.2885850

access: closed

type: Journal Article

metadata version: 2020-05-27

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  - journals/tcas/SantenAH19a
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  - https://dblp.org/rec/journals/tcas/SantenAH19a
Victor M. van Santen, Hussam Amrouch, Jörg Henkel:
Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. Circuits Syst. II Express Briefs 66-II(9): 1527-1531 (2019)

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