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"Modeling and Evaluating the Gate Length Dependence of BTI."
Victor M. van Santen, Hussam Amrouch, Jörg Henkel (2019)
- Victor M. van Santen, Hussam Amrouch, Jörg Henkel:
Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. Circuits Syst. II Express Briefs 66-II(9): 1527-1531 (2019)
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