"Reliability in Super- and Near-Threshold Computing: A Unified Model of ..."

Victor M. van Santen et al. (2018)

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DOI: 10.1109/TCSI.2017.2717790

access: closed

type: Journal Article

metadata version: 2021-10-14

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Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel:
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(1): 293-306 (2018)

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