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"Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults."

Jaehoon Song et al. (2009)

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DOI: 10.1109/TCSII.2009.2022373

access: closed

type: Journal Article

metadata version: 2020-05-27

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  - https://dblp.org/rec/journals/tcas/SongHYJP09a
Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(5): 419-423 (2009)

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