Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable ..."

Amir Zjajo et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TCSI.2010.2055291

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/ZjajoTBGBM11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/ZjajoTBGBM11
Amir Zjajo, Qin Tang, Michel Berkelaar, José Pineda de Gyvez, Alessandro Di Bucchianico, Nick van der Meijs:
Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(1): 164-175 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.