"Accurate and Fast On-Wafer Test Circuitry Integrated With a ..."

Long-Yi Lin, Hao-Chiao Hong (2022)

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DOI: 10.1109/TCSI.2021.3087520

access: closed

type: Journal Article

metadata version: 2022-02-08

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Long-Yi Lin, Hao-Chiao Hong:
Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT. IEEE Trans. Circuits Syst. I Regul. Pap. 69(1): 114-127 (2022)

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