"Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band ..."

Lucas Nyssens et al. (2025)

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DOI: 10.1109/TCSI.2024.3487636

access: closed

type: Journal Article

metadata version: 2025-03-07

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Lucas Nyssens, M. Nabet, Martin Rack, Youssef Bendou, Sidina Wane, Jacques Sombrin, Jean-Pierre Raskin, Dimitri Lederer:
Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications. IEEE Trans. Circuits Syst. I Regul. Pap. 72(2): 753-762 (2025)

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