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"A Robust Time-Based Multi-Level Sensing Circuit for Resistive Memory."

Xueyong Zhang, Byung-Kwon An, Tony Tae-Hyoung Kim (2023)

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DOI: 10.1109/TCSI.2022.3211989

access: closed

type: Journal Article

metadata version: 2023-02-10

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Xueyong Zhang, Byung-Kwon An, Tony Tae-Hyoung Kim:
A Robust Time-Based Multi-Level Sensing Circuit for Resistive Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 70(1): 340-352 (2023)

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