"Four-Port Probe Calibration Using 64-Term Error Model for On-Wafer ..."

Jiefeng Zhou et al. (2025)

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DOI: 10.1109/TCSI.2025.3544672

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type: Journal Article

metadata version: 2025-10-15

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Jiefeng Zhou, Ling Zhang, Ziyang Chen, Da Li, Jun Fan, Erping Li:
Four-Port Probe Calibration Using 64-Term Error Model for On-Wafer S-Parameter Measurement of Microwave Circuits Up to 110 GHz. IEEE Trans. Circuits Syst. I Regul. Pap. 72(10): 5471-5481 (2025)

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