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"Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel ..."

Young-Min Kang et al. (2023)

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DOI: 10.1109/TCSII.2023.3266489

access: closed

type: Journal Article

metadata version: 2023-09-14

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  - https://dblp.org/rec/journals/tcasII/KangPKCK23
Young-Min Kang, Jung-Jin Park, Geon-Hak Kim, Ik-Joon Chang, Jinsang Kim:
Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements. IEEE Trans. Circuits Syst. II Express Briefs 70(9): 3619-3623 (2023)

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