"An In-Circuit Test Method for Measuring the Bonding Resistances of ..."

Rafid Adnan Khan, Saad Yousaf, Gordon W. Roberts (2023)

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DOI: 10.1109/TCSII.2022.3219462

access: closed

type: Journal Article

metadata version: 2023-03-28

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Rafid Adnan Khan, Saad Yousaf, Gordon W. Roberts:
An In-Circuit Test Method for Measuring the Bonding Resistances of Individual IC Pins From an Interconnected Multiple IC Assembly of Flexible Hybrid Electronics. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 939-943 (2023)

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