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"A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS."

Tim Lauber et al. (2024)

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DOI: 10.1109/TCSII.2023.3343470

access: closed

type: Journal Article

metadata version: 2024-03-16

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  - https://dblp.org/rec/journals/tcasII/LauberWBVWH24
Tim Lauber, Lantao Wang, Johannes Bastl, Kenny Vohl, Ralf Wunderlich, Stefan Heinen:
A TDC With Integrated Snapshot Circuit and Calibration in 28-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs 71(3): 1581-1585 (2024)

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