"Cutting Through the Complexity of Reverse Engineering Embedded Devices."

Sam L. Thomas et al. (2021)

Details and statistics

DOI: 10.46586/TCHES.V2021.I3.360-389

access: open

type: Journal Article

metadata version: 2023-08-28

a service of  Schloss Dagstuhl - Leibniz Center for Informatics