"Test-pattern-reduced decoding for turbo product codes with ..."

Guo Tai Chen et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TCOMM.2009.02.0603752

access: closed

type: Journal Article

metadata version: 2020-09-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcom/ChenCYC09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcom/ChenCYC09
Guo Tai Chen, Lei Cao, Lun Yu, Chang Wen Chen:
Test-pattern-reduced decoding for turbo product codes with multi-error-correcting eBCH codes. IEEE Trans. Commun. 57(2): 307-310 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.