"On Reliability Analysis of Smart Grids under Topology Attacks: A ..."

Beibei Li et al. (2019)

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DOI: 10.1145/3127021

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type: Journal Article

metadata version: 2025-01-19

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Beibei Li, Rongxing Lu, Kim-Kwang Raymond Choo, Wei Wang, Sheng Luo:
On Reliability Analysis of Smart Grids under Topology Attacks: A Stochastic Petri Net Approach. ACM Trans. Cyber Phys. Syst. 3(1): 10:1-10:25 (2019)

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