"Local Rational Modeling for Identification Beyond the Nyquist Frequency: ..."

Max van Haren et al. (2025)

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DOI: 10.1109/TCST.2025.3568550

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type: Journal Article

metadata version: 2025-11-09

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Max van Haren, Lennart Blanken, Koen Classens, Tom Oomen:
Local Rational Modeling for Identification Beyond the Nyquist Frequency: Applied to a Prototype Wafer Stage. IEEE Trans. Control. Syst. Technol. 33(6): 2052-2063 (2025)

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