"IPAD: Industrial Process Anomaly Detection Dataset."

Jinfan Liu et al. (2025)

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DOI: 10.1109/TCSVT.2024.3465517

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type: Journal Article

metadata version: 2025-03-05

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Jinfan Liu, Yichao Yan, Junjie Li, Weiming Zhao, Pengzhi Chu, Xingdong Sheng, Yunhui Liu, Xiaokang Yang:
IPAD: Industrial Process Anomaly Detection Dataset. IEEE Trans. Circuits Syst. Video Technol. 35(1): 380-393 (2025)

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