"IM-IAD: Industrial Image Anomaly Detection Benchmark in Manufacturing."

Guoyang Xie et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TCYB.2024.3357213

access: closed

type: Journal Article

metadata version: 2025-11-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcyb/XieWLLLWZJ24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcyb/XieWLLLWZJ24
Guoyang Xie, Jinbao Wang, Jiaqi Liu, Jiayi Lyu, Yong Liu, Chengjie Wang, Feng Zheng, Yaochu Jin:
IM-IAD: Industrial Image Anomaly Detection Benchmark in Manufacturing. IEEE Trans. Cybern. 54(5): 2720-2733 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.