"Understanding Security Risks of Embedded Devices Through Fine-Grained ..."

Qiang Li et al. (2022)

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DOI: 10.1109/TDSC.2021.3119970

access: open

type: Journal Article

metadata version: 2024-06-18

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  - https://dblp.org/rec/journals/tdsc/LiTGWLL22
Qiang Li, Dawei Tan, Xin Ge, Haining Wang, Zhi Li, Jiqiang Liu:
Understanding Security Risks of Embedded Devices Through Fine-Grained Firmware Fingerprinting. IEEE Trans. Dependable Secur. Comput. 19(6): 4099-4112 (2022)

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