"Patent Clustering and Outlier Ranking Methodologies for Attributed Patent ..."

Andrew Rodriguez et al. (2016)

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DOI: 10.1109/TEM.2016.2580619

access: closed

type: Journal Article

metadata version: 2025-11-19

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Andrew Rodriguez, Ali Tosyali, Byunghoon Kim, Jeongsub Choi, Jae-Min Lee, Byoung-Youl Coh, Myong K. Jeong:
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery. IEEE Trans. Engineering Management 63(4): 426-437 (2016)

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