"Submillimeter Accuracy of Multipass Corner Reflector Monitoring by PS ..."

Guillaume Quin, Philippe Loreaux (2013)

> Home

Details and statistics

DOI: 10.1109/TGRS.2012.2206600

access: closed

type: Journal Article

metadata version: 2020-05-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tgrs/QuinL13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tgrs/QuinL13
Guillaume Quin, Philippe Loreaux:
Submillimeter Accuracy of Multipass Corner Reflector Monitoring by PS Technique. IEEE Trans. Geosci. Remote. Sens. 51(3-2): 1775-1783 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.