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"Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis ..."
Nikolaos Dimitriou et al. (2020)
- Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67(7): 5748-5757 (2020)
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