"Residual life predictions from vibration-based degradation signals: a ..."

Nagi Gebraeel et al. (2004)

> Home

Details and statistics

DOI: 10.1109/TIE.2004.824875

access: closed

type: Journal Article

metadata version: 2020-05-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/GebraeelLLP04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/GebraeelLLP04
Nagi Gebraeel, Mark A. Lawley, Richard Liu, Vijay Parmeshwaran:
Residual life predictions from vibration-based degradation signals: a neural network approach. IEEE Trans. Ind. Electron. 51(3): 694-700 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.