"An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient ..."

Xue Hu et al. (2023)

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DOI: 10.1109/TIE.2022.3194584

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type: Journal Article

metadata version: 2023-08-28

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Xue Hu, Hefei Jia, Yuedong Zhang, Yan Deng:
An Open-Circuit Faults Diagnosis Method for MMC Based on Extreme Gradient Boosting. IEEE Trans. Ind. Electron. 70(6): 6239-6249 (2023)

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