"Bayesian Control Loop Diagnosis by Combining Historical Data and Process ..."

Omid Namaki-Shoushtari, Biao Huang (2015)

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DOI: 10.1109/TIE.2014.2375253

access: closed

type: Journal Article

metadata version: 2022-10-28

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Omid Namaki-Shoushtari, Biao Huang:
Bayesian Control Loop Diagnosis by Combining Historical Data and Process Knowledge of Fault Signatures. IEEE Trans. Ind. Electron. 62(6): 3696-3704 (2015)

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