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"Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation ..."

Manuel Domínguez Pumar et al. (2018)

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DOI: 10.1109/TIE.2017.2748033

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/tie/PumarBGLP18
Manuel Domínguez Pumar, Chenna Reddy Bheesayagari, Sergi Gorreta, Gema Lopez-Rodriguez, Joan Pons-Nin:
Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors. IEEE Trans. Ind. Electron. 65(3): 2518-2524 (2018)

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