"A Method for Detecting and Localizing Open-Circuit Switch Faults in MMCs ..."

Navid Rajabi, Ahmad Kalhor, Hossein Iman-Eini (2025)

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DOI: 10.1109/TIE.2025.3557998

access: closed

type: Journal Article

metadata version: 2025-11-09

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Navid Rajabi, Ahmad Kalhor, Hossein Iman-Eini:
A Method for Detecting and Localizing Open-Circuit Switch Faults in MMCs Using Separable Conv2D Neural Networks. IEEE Trans. Ind. Electron. 72(11): 11908-11918 (2025)

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