"Comparison of Thermal Stress During Short-Circuit in Different Types of ..."

Diane-Perle Sadik et al. (2021)

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DOI: 10.1109/TIE.2020.2972442

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type: Journal Article

metadata version: 2021-03-02

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Diane-Perle Sadik, Juan Colmenares, Jang-Kwon Lim, Mietek Bakowski, Hans-Peter Nee:
Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations. IEEE Trans. Ind. Electron. 68(3): 2608-2616 (2021)

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