"Short Circuit Capability Characterization and Analysis of p-GaN Gate ..."

Jiahui Sun et al. (2021)

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DOI: 10.1109/TIE.2020.3009603

access: closed

type: Journal Article

metadata version: 2021-07-13

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Jiahui Sun, Jin Wei, Zheyang Zheng, Kevin J. Chen:
Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests. IEEE Trans. Ind. Electron. 68(9): 8798-8807 (2021)

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