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"Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in ..."
Jiahui Sun et al. (2022)
- Jiahui Sun
, Kailun Zhong
, Zheyang Zheng
, Gang Lyu
, Kevin J. Chen
:
Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs. IEEE Trans. Ind. Electron. 69(7): 7340-7348 (2022)
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