"Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels."

Kyung Ki Kim et al. (2008)

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DOI: 10.1109/TII.2008.924589

access: closed

type: Journal Article

metadata version: 2020-05-21

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Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio Lombardi:
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels. IEEE Trans. Ind. Informatics 4(2): 134-143 (2008)

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