"An improved method for automatic detection and location of defects in ..."

Laurent Béchou et al. (2003)

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DOI: 10.1109/TIM.2003.809071

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/BechouDDDOR03
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003)

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