"A New Measurement Circuit to Evaluate Current Collapse Effect of GaN HEMTs ..."

Guoen Cao, Arsalan Ansari, Hee-Jun Kim (2015)

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DOI: 10.1109/TIM.2014.2366276

access: closed

type: Journal Article

metadata version: 2020-06-08

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Guoen Cao, Arsalan Ansari, Hee-Jun Kim:
A New Measurement Circuit to Evaluate Current Collapse Effect of GaN HEMTs Under Practical Conditions. IEEE Trans. Instrum. Meas. 64(7): 1977-1986 (2015)

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