"A Scan-Chain-Based Built-in Self-Test for ILV in Monolithic 3-D ICs."

Tian Chen et al. (2024)

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DOI: 10.1109/TIM.2024.3472787

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type: Journal Article

metadata version: 2024-11-06

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Tian Chen, Ruiyuan Ding, Jun Liu, Xiaohui Yuan, Yingchun Lu, Huaguo Liang, Siyuan Liu:
A Scan-Chain-Based Built-in Self-Test for ILV in Monolithic 3-D ICs. IEEE Trans. Instrum. Meas. 73: 1-13 (2024)

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