"An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method."

Tao Chen et al. (2020)

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DOI: 10.1109/TIM.2019.2907035

access: closed

type: Journal Article

metadata version: 2022-07-26

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Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020)

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