"Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation."

Chihyun Cho et al. (2015)

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DOI: 10.1109/TIM.2015.2406058

access: closed

type: Journal Article

metadata version: 2020-12-29

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Chihyun Cho, Joo-Gwang Lee, Jeong-Hwan Kim, Dae-Chan Kim:
Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation. IEEE Trans. Instrum. Meas. 64(6): 1413-1418 (2015)

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