"An optimally self-biased threshold-voltage extractor [MOSFET circuit ..."

Ugur Çilingiroglu, Siew Kuok Hoon (2003)

> Home

Details and statistics

DOI: 10.1109/TIM.2003.817903

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/CilingirogluH03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/CilingirogluH03
Ugur Çilingiroglu, Siew Kuok Hoon:
An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing]. IEEE Trans. Instrum. Meas. 52(5): 1528-1532 (2003)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.