"True constant temperature measurement system for lifetime tests of ..."

Carmine Ciofi, Romano Giannetti, Bruno Neri (1998)

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DOI: 10.1109/19.746580

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type: Journal Article

metadata version: 2022-01-03

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Carmine Ciofi, Romano Giannetti, Bruno Neri:
True constant temperature measurement system for lifetime tests of metallic interconnections of IC's. IEEE Trans. Instrum. Meas. 47(5): 1187-1190 (1998)

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