"Fault simulation and response compaction in full scan circuits using HOPE."

Sunil R. Das et al. (2005)

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DOI: 10.1109/TIM.2005.858102

access: closed

type: Journal Article

metadata version: 2020-06-08

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Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu:
Fault simulation and response compaction in full scan circuits using HOPE. IEEE Trans. Instrum. Meas. 54(6): 2310-2328 (2005)

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