"System-on-Chip Test and Characterization: A Review."

Kewei Deng et al. (2025)

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DOI: 10.1109/TIM.2025.3584134

access: closed

type: Journal Article

metadata version: 2025-08-05

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Kewei Deng, Houjun Wang, Zhou Shu, Taochen Gu, Yindong Xiao, Enxiao Liu, Zhenyu Zhao:
System-on-Chip Test and Characterization: A Review. IEEE Trans. Instrum. Meas. 74: 1-28 (2025)

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