"System-on-Chip Test and Characterization: A Review."

Kewei Deng et al. (2025)

> Home

Details and statistics

DOI: 10.1109/TIM.2025.3584134

access: closed

type: Journal Article

metadata version: 2025-07-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/DengWSGXLZ25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/DengWSGXLZ25
Kewei Deng, Houjun Wang, Zhou Shu, Taochen Gu, Yindong Xiao, Enxiao Liu, Zhenyu Zhao:
System-on-Chip Test and Characterization: A Review. IEEE Trans. Instrum. Meas. 74: 1-28 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.