"Noninvasive Profilometry of Sealed Otto Chip Devices by Scanning Optical ..."

Gabriel de Freitas Fernandes et al. (2025)

> Home

Details and statistics

DOI: 10.1109/TIM.2025.3590830

access: open

type: Journal Article

metadata version: 2025-11-02

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/tim/FernandesKLCMF25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/FernandesKLCMF25
Gabriel de Freitas Fernandes, Jung-Mu Kim, Ignacio Llamas-Garro, Gustavo Oliveira Cavalcanti, Joaquim F. Martins-Filho, Eduardo Fontana:
Noninvasive Profilometry of Sealed Otto Chip Devices by Scanning Optical Reflectometry. IEEE Trans. Instrum. Meas. 74: 1-13 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.