"Quality Evaluation of Single-Crystal Wafer X-Ray Detection Using Random ..."

Shouping Guan, Haohong Huang, Tianyi Guan (2023)

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DOI: 10.1109/TIM.2023.3318703

access: closed

type: Journal Article

metadata version: 2023-10-27

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Shouping Guan, Haohong Huang, Tianyi Guan:
Quality Evaluation of Single-Crystal Wafer X-Ray Detection Using Random Vector Functional-Link Network. IEEE Trans. Instrum. Meas. 72: 1-11 (2023)

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