"Uncertainties Caused by Noise for Microwave Interferometric and Reflection ..."

Martin Haase, Karel Hoffmann (2023)

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DOI: 10.1109/TIM.2023.3246502

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type: Journal Article

metadata version: 2023-03-11

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Martin Haase, Karel Hoffmann:
Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)

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