"Embedded test resource for SoC to reduce required tester channels based on ..."

Yinhe Han et al. (2006)

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DOI: 10.1109/TIM.2006.870332

access: closed

type: Journal Article

metadata version: 2023-05-23

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Yinhe Han, Xiaowei Li, Huawei Li, Anshuman Chandra:
Embedded test resource for SoC to reduce required tester channels based on advanced convolutional codes. IEEE Trans. Instrum. Meas. 55(2): 389-399 (2006)

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