"Analysis and evaluation of multisite testing for VLSI."

Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi (2005)

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DOI: 10.1109/TIM.2005.855099

access: closed

type: Journal Article

metadata version: 2020-06-08

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Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. 54(5): 1770-1778 (2005)

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